Nondestructive identification of multiple flaws using XFEM and a topologically adapting artificial bee colony algorithm

Title
Nondestructive identification of multiple flaws using XFEM and a topologically adapting artificial bee colony algorithm
Authors
Keywords
-
Journal
Publisher
Wiley
Online
2013-07-16
DOI
10.1002/nme.4529

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started