Background subtraction practice in X-ray reflectivity reciprocal space mapping and its influence on the structural parameters of thin films

Title
Background subtraction practice in X-ray reflectivity reciprocal space mapping and its influence on the structural parameters of thin films
Authors
Keywords
-
Journal
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES
Volume 55, Issue 1, Pages 96-103
Publisher
Pleiades Publishing Ltd
Online
2012-02-13
DOI
10.1134/s0020441211060248

Ask authors/readers for more resources

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started