Direct comparison of AFM and SEM measurements on the same set of nanoparticles

Published 2015 View Full Article

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Title
Direct comparison of AFM and SEM measurements on the same set of nanoparticles
Authors
Keywords
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Journal
MEASUREMENT SCIENCE and TECHNOLOGY
Volume 26, Issue 8, Pages 085601
Publisher
IOP Publishing
Online
2015-06-25
DOI
10.1088/0957-0233/26/8/085601

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