Analysis of electrical parameters of organic thin film transistors based on thickness variation in semi-conducting and dielectric layers

Title
Analysis of electrical parameters of organic thin film transistors based on thickness variation in semi-conducting and dielectric layers
Authors
Keywords
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Journal
IET Circuits Devices & Systems
Volume 8, Issue 2, Pages 131-140
Publisher
Institution of Engineering and Technology (IET)
Online
2014-01-28
DOI
10.1049/iet-cds.2013.0275

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