Device behavior of an In/p-Ag(Ga,In)Te2/n-Si/Ag heterojunction diode

Authors

Keywords

Thin films, Heterojunctions, Deposition, Electrical transport, Thermal analysis

Journal

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

Volume 34, Issue -, Pages 138-145

Publisher

Elsevier BV

Online

2015-03-04

DOI

10.1016/j.mssp.2015.02.043

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