Efficiently Predicting Hot Spots in PPIs by Combining Random Forest and Synthetic Minority Over-sampling Technique

Title
Efficiently Predicting Hot Spots in PPIs by Combining Random Forest and Synthetic Minority Over-sampling Technique
Authors
Keywords
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Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2018-09-25
DOI
10.1109/tcbb.2018.2871674

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