Investigating conduction mechanism and frequency dependency of nanostructured memristor device

Title
Investigating conduction mechanism and frequency dependency of nanostructured memristor device
Authors
Keywords
Linear drift model, Memristor, Monte Carlo, SCLC
Journal
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Volume 38, Issue -, Pages 228-233
Publisher
Elsevier BV
Online
2015-05-15
DOI
10.1016/j.mssp.2015.04.033

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