An improved X-ray diffraction analysis method to characterize dislocation density in lath martensitic structures

Published 2015 View Full Article

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Title
An improved X-ray diffraction analysis method to characterize dislocation density in lath martensitic structures
Authors
Keywords
Dislocations, X-ray diffraction line profile analysis, Martensite, Mechanical characterization
Journal
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
Volume 639, Issue -, Pages 208-218
Publisher
Elsevier BV
Online
2015-05-12
DOI
10.1016/j.msea.2015.05.003

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