Power Blurring: Fast Static and Transient Thermal Analysis Method for Packaged Integrated Circuits and Power Devices

Published 2014 View Full Article

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Title
Power Blurring: Fast Static and Transient Thermal Analysis Method for Packaged Integrated Circuits and Power Devices
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
Volume 22, Issue 11, Pages 2366-2379
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2014-01-31
DOI
10.1109/tvlsi.2013.2293422
References
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