Design Margin Exploration of Spin-Transfer Torque RAM (STT-RAM) in Scaled Technologies

Published 2009 View Full Article

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Title
Design Margin Exploration of Spin-Transfer Torque RAM (STT-RAM) in Scaled Technologies
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
Volume 18, Issue 12, Pages 1724-1734
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2009-11-18
DOI
10.1109/tvlsi.2009.2032192
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