Local Binary Patterns and Its Application to Facial Image Analysis: A Survey

Title
Local Binary Patterns and Its Application to Facial Image Analysis: A Survey
Authors
Keywords
-
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2011-03-30
DOI
10.1109/tsmcc.2011.2118750

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now