Fast RF-CV Characterization Through High-Speed 1-port S-Parameter Measurements

Title
Fast RF-CV Characterization Through High-Speed 1-port S-Parameter Measurements
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
Volume 25, Issue 3, Pages 310-316
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2012-06-06
DOI
10.1109/tsm.2012.2202752

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