Extending the Limits of Feature-Based SLAM With B-Splines

Authors

Keywords

Journal

Volume 25, Issue 2, Pages 353-366

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2009-02-20

DOI

10.1109/tro.2009.2013496

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started