Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress

Left truncated and right censored Weibull data and likelihood inference with an illustration

(2012) N. Balakrishnan et al.   COMPUTATIONAL STATISTICS & DATA ANALYSIS

Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution

(2012) N. Balakrishnan et al.   IEEE TRANSACTIONS ON RELIABILITY

Bayesian proportional hazards model for current status data with monotone splines

(2011) Bo Cai et al.   COMPUTATIONAL STATISTICS & DATA ANALYSIS

EM algorithm for one-shot device testing under the exponential distribution

(2011) N. Balakrishnan et al.   COMPUTATIONAL STATISTICS & DATA ANALYSIS

Likelihood inference for lognormal data with left truncation and right censoring with an illustration

(2011) N. Balakrishnan et al.   JOURNAL OF STATISTICAL PLANNING AND INFERENCE

An EM algorithm for estimating the parameters of bivariate Weibull distribution under random censoring

(2010) Swagata Nandi et al.   COMPUTATIONAL STATISTICS & DATA ANALYSIS

Parameter estimations for generalized exponential distribution under progressive type-I interval censoring

(2010) D.G. Chen et al.   COMPUTATIONAL STATISTICS & DATA ANALYSIS

Degradation of AlInGaP red LEDs under drive current and temperature accelerated life tests

(2010) M. Vázquez et al.   MICROELECTRONICS RELIABILITY

Evaluation of AlGaInP LEDs reliability based on accelerated tests

(2009) E. Nogueira et al.   MICROELECTRONICS RELIABILITY

Estimating the parameters of the Marshall–Olkin bivariate Weibull distribution by EM algorithm

(2008) Debasis Kundu et al.   COMPUTATIONAL STATISTICS & DATA ANALYSIS

The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing

(2008) Tsai-Hung Fan et al.   JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION