A Bayesian Approach for System Reliability Analysis With Multilevel Pass-Fail, Lifetime and Degradation Data Sets

Title
A Bayesian Approach for System Reliability Analysis With Multilevel Pass-Fail, Lifetime and Degradation Data Sets
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON RELIABILITY
Volume 62, Issue 3, Pages 689-699
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2013-07-03
DOI
10.1109/tr.2013.2270424

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