Addressing Short Trapped-Flux Lifetime in High-Density Field-Reversed Configuration Plasmas in FRCHX

Title
Addressing Short Trapped-Flux Lifetime in High-Density Field-Reversed Configuration Plasmas in FRCHX
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON PLASMA SCIENCE
Volume 42, Issue 5, Pages 1179-1188
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2014-02-26
DOI
10.1109/tps.2014.2305402

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now