SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots With Good Yield

Published 2013 View Full Article

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Title
SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots With Good Yield
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON PLASMA SCIENCE
Volume 41, Issue 11, Pages 3166-3172
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2013-09-27
DOI
10.1109/tps.2013.2281333

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