Journal
IEEE TRANSACTIONS ON PLASMA SCIENCE
Volume 36, Issue 5, Pages 2238-2245Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TPS.2008.2004226
Keywords
Charging; dielectrics; electron; emission
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Funding
- NASA Solar Probe Mission through the Johns Hopkins University Applied Physics Laboratory
- NASA Space Environments and Effects Program
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Electron-induced electron yields of high-resistivity high-yield materials-ceramic polycrystalline aluminum oxide and polymer polyimide (Kapton HN)-were made by using a low-fluence pulsed incident electron beam and charge neutralization electron source to minimize charge accumulation. Large changes in the energy-dependent total yield curves and yield decay curves were observed, even for incident electron fluences of < 3 fC/mm(2). The evolution of the electron yield as charge accumulates in the material is modeled in terms of electron recapture based on an extended Chung-Everhart model of the electron emission spectrum. This model is used to explain the anomalies measured in highly insulating high-yield materials and to provide a method for determining the limiting yield spectra of uncharged dielectrics. The relevance of these results to spacecraft charging is also discussed.
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