Faster and Better: A Machine Learning Approach to Corner Detection

Published 2008 View Full Article

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Title
Faster and Better: A Machine Learning Approach to Corner Detection
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE
Volume 32, Issue 1, Pages 105-119
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2008-12-04
DOI
10.1109/tpami.2008.275

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