Design and Tests of the Vertically Integrated Photon Imaging Chip

Title
Design and Tests of the Vertically Integrated Photon Imaging Chip
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 61, Issue 1, Pages 663-674
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2014-02-07
DOI
10.1109/tns.2013.2294673

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