Displacement Damage Effects in Irradiated Semiconductor Devices

Title
Displacement Damage Effects in Irradiated Semiconductor Devices
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 60, Issue 3, Pages 1740-1766
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2013-06-13
DOI
10.1109/tns.2013.2261316

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