Investigation on the Response of TaO$_{\rm x}$-based Resistive Random-Access Memories to Heavy-Ion Irradiation

Published 2014 View Full Article

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Title
Investigation on the Response of TaO$_{\rm x}$-based Resistive Random-Access Memories to Heavy-Ion Irradiation
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 60, Issue 6, Pages 4520-4525
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2014-01-04
DOI
10.1109/tns.2013.2287615

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