Total Dose Irradiation-Induced Degradation of Hysteresis Effect in Partially Depleted Silicon-on-Insulator NMOSFETs

Authors

Keywords

Journal

Volume 60, Issue 2, Pages 1354-1360

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2013-02-20

DOI

10.1109/tns.2013.2239660

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