4.5 Article

K-Edge Imaging Using Dual-Layer and Single-Layer Large Area Flat Panel Imagers

Journal

IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 59, Issue 5, Pages 1856-1861

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNS.2012.2212250

Keywords

Amorphous selenium; contrast-enhanced mammography; digital mammography; dual-energy; dual-layer; k-edge imaging; X-ray detectors

Funding

  1. Natural Sciences and Engineering Research Council of Canada (NSERC)
  2. Waterloo Institute of Nanotechnology
  3. Ontario Research Fund Research Excellence (ORF-RE)

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Dual-layer, or stacked, detectors reduce motion artifacts in combined x-ray images, such as k-edge images, by acquiring low-and high-energy signals simultaneously. In this work we constructed a prototype single pixel dual-layer detector using amorphous selenium (a-Se) as the conversion material based on the same technology used for commercial large area flat panel imagers. A cascaded detector model was used to model the detector and for comparison with the experimental measurements. The detector was demonstrated to obtain contrast-enhanced mammography signals using an iodinated contrast agent. The experimentally obtained contrast was compared with the model and good agreement was found demonstrating the feasibility of the dual-layer technology. For comparison purposes, a single-layer single pixel detector capable of k-edge imaging but prone to motion artifacts (acquiring low-and high-energy signals sequentially) was also studied.

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