Superior TID Hardness in TiN/HfO$_{2}$/TiN ReRAMs After Proton Radiation

Title
Superior TID Hardness in TiN/HfO$_{2}$/TiN ReRAMs After Proton Radiation
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 59, Issue 5, Pages 2550-2555
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2012-08-21
DOI
10.1109/tns.2012.2208480

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