Growth and Characterization of CZT Crystals by the Vertical Bridgman Method for X-Ray Detector Applications

Title
Growth and Characterization of CZT Crystals by the Vertical Bridgman Method for X-Ray Detector Applications
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 58, Issue 5, Pages 2352-2356
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2011-09-28
DOI
10.1109/tns.2011.2163643

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