Electron Nonionizing Energy Loss for Device Applications

The electron induced nonionizing energy loss (NIEL) for representative device and detector materials are presented here. The electron NIELs are computed analytically using the Mott differential cross section. As for the partition function, which describes the portion of energy deposited into displacing lattice atoms, the expression recently developed by Akkerman et al. was used that better fits for the low recoil energy.