Improving Integrated Circuit Performance Through the Application of Hardness-by-Design Methodology

Title
Improving Integrated Circuit Performance Through the Application of Hardness-by-Design Methodology
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 55, Issue 4, Pages 1903-1925
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2008-09-30
DOI
10.1109/tns.2008.2000480

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