Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 55, Issue 3, Pages 1532-1535Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNS.2008.922844
Keywords
concentration quenching; fluorescence lifetime; luminescence; nanophosphor; oxyorthosilicates
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Nanophosphor Y2SiO5:Ce (n-YSO), LU2SiO5:Ce (n-LSO), and Gd2SiO5:Ce (n-GSO) were prepared by solution-combustion synthesis yielding nanophosphor crystallite sizes between 20 nm - 80 nm. Ce dopant concentrations were varied between 0.1%-10% for each the nanophosphors and concentration quenching curves were measured by radioluminescence (RL) and photoluminescence (PL). n-YSO exhibits concentration quenching at 1 at% and 4 at% under uv and x-ray excitation, respectively. Red shifted emission with a larger Stokes shift is observed for nanophosphors as compared to bulk crystals. The measured PL lifetime depended on the refractive index of the media, indicating that the PL originates from the surface. Measurements of the RL/PL intensity indicate that the light output of these materials is comparable to the bulk crystal.
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