Multiple Bit Upsets and Error Mitigation in Ultra-Deep Submicron SRAMS

Published 2009 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Multiple Bit Upsets and Error Mitigation in Ultra-Deep Submicron SRAMS
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 55, Issue 6, Pages 3288-3294
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2009-01-21
DOI
10.1109/tns.2008.2006893
References
View 1 related references

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.