3-D Mixed-Mode Simulation of Single Event Transients in SiGe HBT Emitter Followers and Resultant Hardening Guidelines

Authors

Keywords

Journal

Volume 55, Issue 6, Pages 3360-3366

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2009-01-21

DOI

10.1109/tns.2008.2006840

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