Analysis of the Voltage–Time Dilemma of Metal Oxide-Based RRAM and Solution Exploration of High Speed and Low Voltage AC Switching

Authors

Keywords

Journal

Volume 13, Issue 6, Pages 1127-1132

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2014-07-25

DOI

10.1109/tnano.2014.2340571

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