Switching of Dipole Coupled Multiferroic Nanomagnets in the Presence of Thermal Noise: Reliability of Nanomagnetic Logic

Authors

Keywords

Journal

Volume 12, Issue 6, Pages 1206-1212

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2013-11-12

DOI

10.1109/tnano.2013.2284777

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