4.4 Article

Electrical Characterization of Photoconductive GaN Nanowires from 50 MHz to 33 GHz

Journal

IEEE TRANSACTIONS ON NANOTECHNOLOGY
Volume 10, Issue 4, Pages 832-838

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNANO.2010.2084588

Keywords

Microwave measurements; nanotechnology; nanowires; photoconductivity; semiconductor devices

Funding

  1. DARPAN/MEMS [HR0011-06-1-0048]

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The electrical response of two-port photoconductive GaN nanowire devices was measured from 50 MHz to 33 GHz. The admittance of the nanowire devices showed an increase on the order of 10% throughout the measured frequency range after exposure to steady ultraviolet illumination. Two different two-port microwave network models were used to extract microwave circuit parameters in the photoconductive and dark states. After illumination, the GaN nanowire devices showed a measurable increase in shunt capacitance and decreases in both the contact and nanowire resistances.

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