Journal
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
Volume 60, Issue 12, Pages 3844-3855Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMTT.2012.2221733
Keywords
Multiport network analyzer; uncertainty; vector network analyzer (VNA) calibration
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An analytical approach to compute the uncertainty of multiport scattering parameter measurements is presented. First, the various uncertainty causes from the noise to the standard definitions are modeled and characterized, then the uncertainty propagation up to the device-under-test measurement is computed. Experiments confirm the validity of this general approach.
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