Journal
IEEE TRANSACTIONS ON MAGNETICS
Volume 45, Issue 5, Pages 2221-2223Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMAG.2009.2016156
Keywords
Conductive-atomic force microscopy (C-AFM); jitter; recording mark; writing strategy
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The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance.
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