4.4 Article Proceedings Paper

Imaging of Recording Marks and Their Jitters With Different Writing Strategy and Terminal Resistance of Optical Output

Journal

IEEE TRANSACTIONS ON MAGNETICS
Volume 45, Issue 5, Pages 2221-2223

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMAG.2009.2016156

Keywords

Conductive-atomic force microscopy (C-AFM); jitter; recording mark; writing strategy

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The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance.

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