An Effective Defect Inspection Method for LCD Using Active Contour Model

Title
An Effective Defect Inspection Method for LCD Using Active Contour Model
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume 62, Issue 9, Pages 2438-2445
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2013-07-04
DOI
10.1109/tim.2013.2258242

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