Journal
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume 61, Issue 5, Pages 1334-1342Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIM.2012.2183429
Keywords
Characterization; Levenberg-Marquardt algorithm (LMA); Monte Carlo simulation; optimization algorithm; photovoltaic (PV) cell model; uncertainty; validation
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This paper describes a theoretical approach to evaluate the uncertainty on the series and shunt resistances estimated by the seven-parameter (double diode) model of a photovoltaic (PV) cell using data commonly provided by panel manufacturers, measured environmental parameters, and semiempirical equations. After a brief survey on the state of the art and the treatment of the double-diode model, the procedure proposed by the authors, to estimate the unknown parameters, is illustrated. The theoretical expression of the uncertainty, which affects the estimation of the series and shunt resistances (namely, R-s and R-sh) of a PV cell, is then derived. A statistical analysis performed by means of a Monte Carlo simulation is in agreement with the theoretical expression of the uncertainty.
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