On Statistical Tests for Randomness Included in the NIST SP800-22 Test Suite and Based on the Binomial Distribution

Published 2012 View Full Article

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Title
On Statistical Tests for Randomness Included in the NIST SP800-22 Test Suite and Based on the Binomial Distribution
Authors
Keywords
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Journal
IEEE Transactions on Information Forensics and Security
Volume 7, Issue 2, Pages 491-505
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2012-02-01
DOI
10.1109/tifs.2012.2185227

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