Statistical Fluctuations in HfOx Resistive-Switching Memory: Part I - Set/Reset Variability

Published 2014 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Statistical Fluctuations in HfOx Resistive-Switching Memory: Part I - Set/Reset Variability
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 61, Issue 8, Pages 2912-2919
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2014-07-02
DOI
10.1109/ted.2014.2330200

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.