Submicrometer Organic Thin-Film Transistors: Technology Assessment Through Noise Margin Analysis of Inverters

Published 2014 View Full Article

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Title
Submicrometer Organic Thin-Film Transistors: Technology Assessment Through Noise Margin Analysis of Inverters
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 61, Issue 5, Pages 1508-1514
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2014-03-22
DOI
10.1109/ted.2014.2304624

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