A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis

Published 2014 View Full Article

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Title
A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 61, Issue 8, Pages 2668-2673
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2014-06-26
DOI
10.1109/ted.2014.2329020

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