Temperature-Dependent Instability of Bias Stress in InGaZnO Thin-Film Transistors

Published 2014 View Full Article

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Title
Temperature-Dependent Instability of Bias Stress in InGaZnO Thin-Film Transistors
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 61, Issue 6, Pages 2119-2124
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2014-05-10
DOI
10.1109/ted.2014.2319105

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