Room to High Temperature Measurements of Flexible SOI FinFETs With Sub-20-nm Fins

Published 2014 View Full Article

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Title
Room to High Temperature Measurements of Flexible SOI FinFETs With Sub-20-nm Fins
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 61, Issue 12, Pages 3978-3984
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2014-12-13
DOI
10.1109/ted.2014.2360659

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