Bias-Temperature-Stress Characteristics of $ \hbox{ZnO/HfO}_{2}$ Thin-Film Transistors

Authors

Keywords

Journal

Volume 59, Issue 5, Pages 1488-1493

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2012-04-05

DOI

10.1109/ted.2012.2189048

References

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