Work-Function-Tuned TiN Metal Gate FDSOI Transistors for Subthreshold Operation

Title
Work-Function-Tuned TiN Metal Gate FDSOI Transistors for Subthreshold Operation
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 58, Issue 2, Pages 419-426
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2010-12-15
DOI
10.1109/ted.2010.2092779

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