One-Dimensional Thickness Scaling Study of Phase Change Material $(\hbox{Ge}_{2}\hbox{Sb}_{2}\hbox{Te}_{5})$ Using a Pseudo 3-Terminal Device

Published 2011 View Full Article

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Title
One-Dimensional Thickness Scaling Study of Phase Change Material $(\hbox{Ge}_{2}\hbox{Sb}_{2}\hbox{Te}_{5})$ Using a Pseudo 3-Terminal Device
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 58, Issue 5, Pages 1483-1489
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2011-04-07
DOI
10.1109/ted.2011.2121911

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