Comprehensive Study on Negative Capacitance Effect Observed in MOS(n) Capacitors With Ultrathin Gate Oxides

Published 2011 View Full Article

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Title
Comprehensive Study on Negative Capacitance Effect Observed in MOS(n) Capacitors With Ultrathin Gate Oxides
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 58, Issue 3, Pages 684-690
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2011-01-22
DOI
10.1109/ted.2010.2102033

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