Correlation Between Measured Minority-Carrier Lifetime and $\hbox{Cu}( \hbox{In}, \hbox{Ga})\hbox{Se}_{2}$ Device Performance

Published 2010 View Full Article

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Title
Correlation Between Measured Minority-Carrier Lifetime and $\hbox{Cu}( \hbox{In}, \hbox{Ga})\hbox{Se}_{2}$ Device Performance
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 57, Issue 11, Pages 2957-2963
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2010-09-08
DOI
10.1109/ted.2010.2066130

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