Origin of the Flatband-Voltage Roll-Off Phenomenon in Metal/High- $k$ Gate Stacks

Published 2010 View Full Article

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Title
Origin of the Flatband-Voltage Roll-Off Phenomenon in Metal/High- $k$ Gate Stacks
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 57, Issue 9, Pages 2047-2056
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2010-08-24
DOI
10.1109/ted.2010.2051863

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